Model LN50 Low Temperature & Vacuum Manual Prober Station

LN50 Vacuum Low Temperature Probe Stage

LN50 Low-Temperature Probe Stage is designed for testing the low-temperature performance of devices, with the maximum size reaching 51mm (2 inches). It provides a testing platform for electrical properties, photoelectric properties, parameter measurements, high Z measurements, DC measurements, RF measurements, and microwave characteristics of materials or devices. Nanoelectronic materials, mechanical devices, and semiconductor materials are typical materials measured on the low-temperature probe stage. The system offers a variety of probe types, test cables, and sample holders to meet different user needs. The temperature range is from 78K to 475K (using liquid nitrogen), with the sample stage from 80K to 400K. The system requires liquid nitrogen for temperature variation, and the thermal radiation shield significantly reduces blackbody radiation, enhancing cooling efficiency. Heaters installed on the cold head reduce the temperature gradient of the sample, along with heaters on the thermal radiation shield, allowing for rapid temperature changes throughout the system.

Application: Materials, Components, Optoelectronics, Radio Frequency

Feature

Thermochromic sample platform: 50mm diameter.

Sample temperature range: 80K to 400K. Temperature control stability is better than ±0.5K.

Optional fiber optic interface, which can replace one or more electrical probes with fiber optics.

System Direct Current Leakage: <1pA

Vacuum腔体: Vacuum degree < 6×10^-4 Pa

Probe Control: Standard with 4 probe arms. Adjustment range: 50mm x 50mm x 30mm.

Adjustment accuracy better than 10um.

Microscope Module: Continuous magnification monocular microscope, optical magnification:

1.4X~9X (with 1X additional lens), video magnification approximately 700

Resolution < 2um.