The MPS150SV is a 6-inch probe station, suitable for users who require precise IV/CV testing of semiconductor devices and materials, and wafer slices in a short period of time. When combined with a semiconductor device analyzer, it can serve as a semiconductor device analysis and testing platform for the lab.

The MPS150SV probe station ensures high-quality contact during the wafer measurement cycle, achieved through a very stable system platform design and a perfect vibration isolation solution, allowing users to achieve the desired measurement accuracy. The industrial-standard probe holder, optimized for optical performance and with no reverse gap in X-Y-Z movement, achieves 1μm repeatability in contact separation drive, offering a more precise placement compared to semi-automatic probe station probe holders. High-quality triaxial signal cables ensure that the test characteristics current reaches the fA level. The low-noise wafer holder offers heating options, making device testing easier.

The stage features an X-Y-Z rotary knob design, allowing one-handed adjustment, with a highly flat surface and adjustable...

Mobility, making it easy for beginners and users to operate and get started

The probe station design features upgradability and expandability, such as upgradeable impedance measurement (with impedance matching...).

Analyzer), capacitance testing up to fF level. Protects the user's initial investment.

Product Features:

Empower Users to Become Low-Noise Measurement Experts: Universal Platform for Semiconductor Material Wafer I-V/C-V Testing

i-V Test Achieves fA Level: All triaxial cables, high-quality probe sockets

Always ensure contact stability: compact and robust mechanical structure design; protect every user's future investment; configurable for upgrades to meet future needs.

Training operations are time-efficient: Simple and user-friendly design