Product Description

Miniature vacuum high/low temperature probe stage is designed for electrical tests under vacuum and temperature variation conditions. It can control the temperature within the range of -190~400°C, enabling in-situ optical and electrical temperature variation tests of samples under vacuum environment, with reflection/transmission capabilities.

Supports compatibility with instruments such as microscopes, spectrometers, semiconductor testers, and electrical source meters.

Core Technology

Technical Specifications

Application Cases