Product Introduction
The system composition of the general probe stage includes:1. Probe Stage 2. Stereoscopic Microscope 3. Monocular Microscope 4. Metallographic Microscope 5. Observation Camera Module 6. Probe Holder & Fixture 7. DC Probe 8. Kelvin Probe 9. RF/Microwave Probe 10. Optical Wave Probe 11. Optical Vibration Isolation Stage 12. Shielded Black Box 13. Adapter 14. Vacuum Pump 15. Other Upgrade Components
Core Advantages
Technical Specifications
I. The system composition of the probe stage includes:
Probe Stage Body
2. Stereoscopic Microscope
3. Monocular Microscope
4. Metallographic Microscope
5. Inspect Camera Components
6. Probe Mount & Clamp
7. DC Probes
8. Kelvin Probe
9. RF/Microwave Probe
10. Optical Wave Probe
11. Optical Vibration Isolation Platform
12. Black Box Blocking
13. Adapter Connector
14. Vacuum Pump
15. Additional Upgrade Components
Section II: Detailed Description:
(1) Overall Specifications and Features:
Weight: 60 kg
2. Dimensions: 580mm (W) x 520mm (D) x 700mm (H)
3. Ergonomically optimized design for comfortable long-term operation by engineers.
(II) Needle Bar Table Specifications:
U-shaped fixed countertop, polished stainless steel + corrosion-resistant oxidation material, flatness: ±3μm
(3) Platform Specifications:
1.6-inch vacuum adsorption sample platform, with gas supply, flatness: ±3μm, adsorbs samples using vacuum adsorption method, small vacuum adsorption size: 0.5mm x 0.5mm, vacuum adsorption size: 150mm x 150mm
2. Sample Stage X-Y Moving Platform, travel 150mm x 150mm, fine adjustment accuracy of 1μm, backlash-free linear adjustment
3. The sample table advances quickly in the Y-direction, retracting 2 inches, for easy pick-up and placement of samples by express delivery.
4. Sample table Z-axis fine adjustment lifting and lowering 10mm, fine adjustment accuracy of 1μm
5. Sample table offers horizontal θ angle adjustment range of 0° to 360°, with fine adjustment of ±10° and precision of 0.01°.
6. The sample stand is electrically independently suspended, capable of grounding or applying back-grid voltage.
(4) Microscope Control Specifications:
The microscope features an X-Y axis adjustment wheel on the back, which allows for the adjustment of the microscope's movement in the X-Y direction. The movement range is 50mm x 50mm, with an accuracy of 1μm.
2. The microscope's Z-axis features a coarse focusing knob and a fine focusing knob. The coarse knob allows for quick focusing, while the fine knob facilitates precise focusing. This enables the microscope to travel 50.8mm along the Z-axis with a movement precision of 1μm.
3. Rapid ±30° tilt function for microscopes, facilitating quick lens switching and preventing needle collisions during lens changes.
Application Scenarios:
DC IV/CV Testing
2. Pulse IV Test
3. Impedance Test
4. Time Domain Analysis Test
5. Active RF Testing
6. Passive RF/Microwave Testing
