Core Advantages

Technical Specifications

I. The system composition of the probe stage includes:

Vacuum Probe Stage Body

2. Temperature Control System

3. Variable Magnetic Field

4. Single-Objective Microscope

5. Stereoscopic Microscope

6. Monitor Camera Components

DC Probe

8. Kelvin Probe

9. RF/Microwave Probe

10. Optical Wave Probe

11. Optical Isolation Platform

12. Adapter plug

13. Additional Upgrade Components

Section 2: Detailed Description:

(1) Temperature Range:

Sealed Low Temperature + High Temperature: -60℃ ~ +120℃ / 200℃ / 400℃

2. Vacuum Low Temperature + High Temperature: -190°C / 269°C ~ +120°C / 200°C / 400°C / 500°C / 900°C / 1200°C

(II) Sample Table Dimensions:

Sealed High/Low Temperature Sample Platforms: 4" / 6" / 8" / 12"

2. Vacuum High/Low Temperature Sample Platforms: 1.25" / 2" / 4"

(Microscopic Observation Magnification: )

Stereo Microscope: Total magnification range of 14X~200X (with CCD camera + monitor), optical resolution approximately 5 micrometers.

2. Metallographic Microscope: Total magnification range 20X~2000X (with CCD camera and monitor), optical resolution approximately 0.5 micrometers.

(Four) Micro-positioning Mounts and Clamps:

1. The devices are multi-port, with diodes having 2 terminals, transistors having 3 terminals, field-effect transistors having 4 terminals, and special multi-port devices.

2. What parameters to measure, such as voltage, current, resistance, capacitance, monochromatic light, laser, spectrum, light intensity, etc.

3. Matching instruments, including digital source meters, semiconductor parameter analyzers, vector network analyzers, spectrometers, signal generators, oscilloscopes, phase-locked amplifiers, etc.