Probe based profiler/stair step profiler/P-7 Stylus Profiler
The P-7 supports step height measurement from a few nanometers to one millimeter, suitable for production and research and development environments. The system can perform 2D and 3D measurements of step height, roughness, curvature, and stress, with a scanning range of up to 150mm without the need for image stitching.
Product description
The P-7 is built on the successful foundation of the P-17 desktop probe profile analysis system that has captured the market. It maintains the excellent measurement performance of P-17 technology and provides high cost-effectiveness as a desktop probe profiler platform. The P-7 can perform 2D and 3D measurements of step height, roughness, curvature, and stress, with a scanning range of up to 150mm without the need for image stitching.
Main functions
Step height: several nanometers to 1000 μ m
Micro force constant force control: 0.03 to 50mg
Sample full diameter scanning, no need for image stitching
Video: 5-megapixel high-resolution color camera
Arc correction: Eliminating errors caused by the arc-shaped motion of the probe
Software: Simple and easy-to-use software interface
Production capacity: Fully automated through sequencing, pattern recognition, and SECS/GEM
Main applications
Step height: 2D and 3D step height
Texture: 2D and 3D roughness and waviness
Shape: 2D and 3D warping and shaping
Stress: 2D and 3D thin film stress
Defect re inspection: 2D and 3D defect surface morphology
industrial applications
Universities, research laboratories, and institutes
Semiconductors and compound semiconductors
LED: Light Emitting Diode
solar energy
MEMS: Micro Electro Mechanical Systems
data storage
car
More: Please contact us to meet your requirements