Product description

P-17 is the eighth generation desktop probe profiler, which is the culmination of over 40 years of surface measurement experience. This system surpasses the industry and supports 2D and 3D measurements of step height, roughness, curvature, and stress. Its scanning can reach 200mm without the need for image stitching.
This system combines UltraLite ® Sensors, constant force control, and ultra flat scanning platform provide excellent measurement stability. The program settings are simple and fast through functions such as point and click platform control, top and side view optical systems, and high-resolution cameras with optical zoom. P-17 is equipped with various filters, leveling, and analysis algorithms for quantifying surface morphology, and can support 2D or 3D measurements. And achieve fully automatic measurement through pattern recognition, sorting, and feature detection.
Main functions
Step height: several nanometers to 1000 μ m
Micro force constant force control: 0.03 to 50mg
Sample full diameter scanning, no need for image stitching
Video: 5-megapixel high-resolution color camera
Arc correction: Eliminating errors caused by the arc-shaped motion of the probe
Software: Simple and easy-to-use software interface
Production capacity: Fully automated through sequencing, pattern recognition, and SECS/GEM
Main applications
Step height: 2D and 3D step height
Texture: 2D and 3D roughness and waviness
Shape: 2D and 3D warping and shaping
Stress: 2D and 3D thin film stress
Defect re inspection: 2D and 3D defect surface morphology
industrial applications
Universities, research laboratories, and institutes
Semiconductors and compound semiconductors
LED: Light Emitting Diode
solar energy
MEMS: Micro Electro Mechanical Systems
data storage
car
More: Please contact us to meet your requirements