Low noise level and high resolution in the same AFM categoryThe Innova Scanning Probe Microscope (SPM) boasts high resolution and versatility, widely used in device characterization, physical chemistry, life sciences, and materials science. It's an affordable, simple setup suitable for scientific research. The Innova features a closed-loop scanning linearization system, ensuring measurement accuracy and maintaining low noise levels comparable to those of an open-loop system.

During Innova sample testing, experiments can be conducted on samples ranging from sub-micron sizes up to 90 micrometers, achieving atomic-level resolution. No need to change scanners or other hardware for measuring samples of different sizes; replacing probes or samples is simple and straightforward; integrated high-resolution color optical systems and programmable automated Z-axis adjustment systems allow for quick and easy location of polymer material characterization in the area to be measured, integrated optical path measurement, material mechanical property characterization, MEMS manufacturing, cell surface morphology observation, structural and property studies of biomacromolecules, data storage, properties research of metals/alloys/metal vapor deposition, food and chemical processing/packaging, liquid crystal material property characterization, molecular devices, biosensors, molecular self-assembly structures, optical disc storage, ceramic processing, film property characterization, high-resolution applications in geology, energy, and environmental fields.

Innova's mechanical and electrical design optimizations include a robust microscope platform with a short mechanical path and low thermal drift, low-noise electronic components, and a combination of high resolution and closed-loop scanning. The low-noise digital closed-loop linearized scanning ensures accurate measurements of samples regardless of the scan size, offset, scan speed, or rotation angle settings, resulting in high-resolution imaging.

Performance

In terms of Innova's electromechanical design, optimizations have been made across the board, from robust microscope platforms with short mechanical paths and low temperature drift to low-noise electronic components, resulting in a combination of high-resolution performance and closed-loop scanning.

Innova utilizes a low-noise digital closed-loop linearization scanning that ensures accurate measurements of dimensions, regardless of the scan size, offset, scan speed, or rotation angle settings. High-quality images are achievable across the imaging range from 90 micrometers to sub-micrometers, with closed-loop noise levels nearly equivalent to open-loop levels. Additionally, the closed-loop linearization scanning can be activated or deactivated online. This remarkable flexibility allows for any part of a full-size scan to be magnified to atomic resolution scanning without changing the scanner or lifting the probe from the measurement surface. The rotation of the image, its position in the imaging window, and the scan speed do not affect the imaging results.

Industry Applications:

What's your application — Innova is ready:

• Material Science

• Nano Etching

• Life Sciences

• Polymer

• Device characterization