ContourGT-X for工艺质量监控标准化测试系统Brook Optics ProfileMeterThis instrument is suitable for both laboratory development and mass production. It has accumulated the experience from the first ten generations of products in white light interference technology, enabling rapid three-dimensional surface measurements. It can measure from nanometer-level roughness surfaces to millimeter-scale steps, with a vertical resolution down to sub-nanometer levels. The programmable XYZ control and automatic scanner head operation make the instrument easy to operate. The included Vision64 software offers industry-standard measurement and data analysis functions, and its optimized user interface facilitates users in defining automatic measurements and data analysis.

    ContourGT-X Brook Optics Profile MeterIt is a white light interferometer, suitable for various industries such as ophthalmic lenses, medical devices, high-brightness LEDs, semiconductor devices, TSVs, solar cell panels, automotive parts, touchscreens, and processed components. It provides users with fast and accurate non-contact 3D measurements. The internal laser self-calibration technology can automatically calibrate drifts caused by environmental or mechanical instability without the need for a standard block. The white light interferometers are used by the industry in the fields of LED, solar, touchscreen, semiconductor, data storage, scientific research, product development, quality control, and failure analysis, as well as in universities and research institutes.

The ContourGT-X is equipped with an adjustable tilt bracket, an automatic XYZ sample stage, and an automatic eyepiece field changer, making the testing process faster and more convenient. The space-saving and high-stability base design, along with an integrated vibration-damping system, ensures the system's vibration resistance and stability. Equipped with the new Vision64 software, it features industry-standard instrument measurement and data analysis capabilities, with an optimized user interface that facilitates users' self-definition of automatic measurement and data analysis.

Brooke Optical Contour Meter Features:

· Industry benchmark, high vertical resolution under wide field of view

   ·Achieve characterization of various surface shapes and textures with magnification ratios ranging from 0.5x to 200x

· Optimized hardware design further enhances the instrument's noise resistance, system flexibility, and measurement stability

   · Laser self-calibration technology ensures consistent measurement data among instruments, with high repeatability and accuracy

   ·Excellent stitching capabilities allow for seamless connection of over a thousand data points, enabling large-area sample testing

   ·Multi-core processors and 64-bit software enhance data analysis speed