DX-2012M Silicon Steel Material Automatic Measuring Device
The DX-2012M silicon steel material measuring device is suitable for measuring various hot-rolled, cold-rolled oriented and non-oriented silicon steel materials, as well as the measurement of shaped silicon steel transformer cores. It can accurately measure the magnetic induction Bm, specific total losses Ps, hysteresis loops, and AC magnetization curves of silicon steel materials under power frequency conditions. It complies with the standards of GB/T3655-2000, GB/T13789-92, and IEC 60404-6. The device employs single-chip microcontroller control technology and A/D sampling, replacing traditional analog bridges, frequency meters, ammeters, voltmeters, and wattmeters, with the entire testing process automated. It can also communicate directly with a microcomputer via the RS-232 interface, using microcomputer and master station software to control the testing and record test results. The DX-2012M silicon steel material automatic measurement system currently includes four models: 500VA, 1000VA, 2000VA, and 5000VA.
| DX-2012M Automatic Silicon Steel Material Measuring Device, Compliant with Standards |
● GB/T3655-2008 "Method for Measuring the Magnetic Properties of Electrical Steel Sheets (Strips) Using the Epstein Frame" ● JJG405-1986 "Standard Sample of Silicon Steel Sheet (Strip)" ● Method for Measuring Magnetic Properties of Electrical Steel (Strip) Using Single-Channel Tester - GB/T 13789-2008 ● Method for Measuring the Magnetic Properties of Electrical Steel Sheets (Strips) Using the Epstein Frame in accordance with IEC 60404-2 ● Methods for Measuring Magnetic Properties of Electrical Steel Sheets (Strips) Using Single-Element Test Instruments - IEC 60404-3 IEC 60404-6 "Magnetic Materials — Part 6: Test Methods for Magnetic Properties of Ring Specimens of Soft Magnetic and Powder Metallurgy Materials at Frequencies from 20 Hz to 200 kHz" |
| DX-2012M Silicon Steel Material Automatic Measurement Device Hardware Features |
● Equipped with a 32-bit ARM embedded high-speed processor, featuring powerful data processing capabilities. ● Synchronous sampling technology ensures accuracy and repeatability in sampling. ● Can perform single-point or multi-point tests independently (no computer required), featuring a 320×240 large-screen LCD display that can show various waveforms, curves, and measurement results, suitable for on-site testing needs in factories and enterprises. ● Average single-point test time is approximately 3 seconds, and direct testing on the panel can be performed at frequencies of 40-1000Hz. ● Features harmonic testing and analysis capability for the fundamental wave amplitude 10% and harmonic order 64. |
| DX-2012M Silicon Steel Material Automatic Measurement Device Software Features |
● Directly measure online with a single click, the LCD screen displays all parameters and curves. Connect to a microcomputer for automatic control and save test data. ● Sorting function provided for key parameters (Br, Bm, Hc, Hm, Ps, ua) ● Accurate Measurement: Frequency f, primary current peak, secondary voltage peak, active power and apparent power. ● Accurate Measurements: Magnetic Flux Density Bm, Excitation Magnetic Field Strength Hm, Amplitude Permeability ua, Loss Angle δ, and Specific Total Loss Ps. ● Precise Conversions: Elastic permeability u', Viscous permeability u", Inductive permeability uL, Resistive permeability uR, Quality factor, and Inductive constant AL. Provide reports on test I-V-B waveforms, B-H hysteresis loops (clusters), AC μ&B-H permeability curves, magnetization curves, and Ps-B total loss curves. ● Features include lock B, lock H, and lock frequency f testing. ● Features superimposed harmonic test analysis, including harmonic order selection; Overlay harmonic amplitudes with manual intervention and accurately measure harmonic losses. ● Automatically completes data calculations post-testing, featuring an auto-correcting range coefficient function. The file system uses a database format, allowing test results to be printed directly or outputted to Excel spreadsheets. The file management feature is robust, including functions such as automatic data saving, data deletion, and clearing all data. The data file includes complete sampling data, sample parameters, and instrument parameters, which can be input into other software. |
DX-21012M Silicon Steel Material Automatic Measurement Device Main Technical Parameters
| 1. System Parameters |
Processor: 32-bit ARM Embedded High-Speed Processor Interface: RS232, capable of connecting to a microcomputer for supervisory software control ● Display: 320×240 pixel matrix, 5.7-inch LCD screen (high-brightness LED backlit) |
| 2. Built-in Excitation Power Supply Technical Parameters |
There are four available excitation power sources: 500VA, 1000VA, 2000VA, and 5000VA. Output Power: 500VA Sinewave Output Frequency: 40Hz~1000Hz, Fineness < 1/10,000 of the set value Frequency Error: ±0.05% of the set value Output Voltage: 0-2-10-50-300V (RMS) in four automatic steps Output Current: 0 ~ 20 ~ 200 ~ 2000 ~ 20000 mA (peak) in four automatic steps ● Voltage Distortion: Better than 0.5% ● Voltage Stability: Better than 0.2% ● Signal Generation Method: DDS Digital Frequency Synthesis ● D/A Converter: 16-bit Bipolar Analog-to-Digital Converter
Output Power: 1000VA Sine Wave ● Output Frequency: 40Hz to 1000Hz; Fineness < 1/10,000 of the set value Frequency Error: ±0.05% of the set value Output Voltage: 0-1-2-5-10-20-50-100-200V (RMS) - 8-step automatic output Output Current: 0 ~ 20 ~ 200 ~ 2000 ~ 20000 mA (peak) in four automatic levels ● Voltage Distortion: Better than 0.5% ● Voltage Stability: Better than 0.2% ● Signal Generation Method: DDS Digital Frequency Synthesis ● D/A Converter: 16-bit Bipolar Analog-to-Digital Converter
Output Power: 2000VA Sinewave ● Output Frequency: 40Hz ~ 1000Hz, Fineness < 1/10,000 of the set value Frequency Error: ±0.05% of the set value Output Voltage: 0~1~2~5~10~20~50~100~200V (RMS) - 8-step automatic output Output Current: 0-40-400-4000-40000 mA (peak) with four-stage automatic output ● Voltage Distortion: Better than 0.5% Voltage Stability: Better than 0.2% ● Signal Generation Method: DDS Digital Frequency Synthesis ● D/A Converter: 16-bit Bipolar Analog-to-Digital Converter
Output Power: 5000VA Sinewave Output Frequency: 40Hz to 1000Hz, Fineness < 1/10,000 of the set value Frequency Error: ±0.05% of the set value Output Voltage: 0-2-4-10-20-50-100-200-400V (RMS) with eight automatic output steps Output Current: 0 ~ 50 ~ 500 ~ 5000 ~ 50000 mA (peak) in four automatic steps ● Voltage Distortion: Better than 0.5% Voltage Stability: Better than 0.2% ● Signal Generation Method: DDS Digital Frequency Synthesis ● D/A Converter: 16-bit Bipolar Analog-to-Digital Converter |
| 3. Sampling Technical Parameters |
● A/D Converter: 1MHz dual-channel 16-bit synchronous analog-to-digital converter ● Voltage Sampling Range: 0.25V, 5V, 100V, 2000V (peak), Voltage Measurement Accuracy: ● Better than ±0.05%*RG (where RG is the range value), voltage resolution: 0.002mV. ● Current sampling range: 50mA, 500mA, 5A, 50A (peak) |
| 4. Measurement Accuracy |
(Preheat for 10 minutes at 23℃±5℃ with 30-75%RH and free from external magnetic field interference) ● Magnetic B Locking Accuracy: ±0.3% ● Magnetic B Sensing Measurement Accuracy: ±(0.2% + 0.1% × (Vf/Vr - 1)) ● (Vf: Inductive voltage sampling range full scale, Vr: Inductive voltage measurement peak) ● (Vf/Vr-1) ≤2 (30V, 300V voltage sampling range) ● H-Field Locking Precision: ±0.5% H Magnetic Field Measurement Accuracy: ±(0.2% + 0.1% × (If/Ir - 1)) ● (If: Excitation Current Sampling Range is Full Scale, Ir: Excitation Current Measurement Peak) ● (If/Ir-1) ≤2 (300mA, 3000mA, 30000mA current sampling ranges) ● Total Loss Ratio (Ps): ±(1.0 + (Φ/90°)×0.05×tan(Φ)) % Φ: Phase angle between induced voltage and excitation current |
| 5. DX-2012M Silicon Steel Material Automatic Measurement System Uncertainty and Accuracy |
| 50 Hz under conditions | Bm(%) | Hm(%) | μa(%) | Ps(%) | δ(%) |
| Uncertainty (K=2) | 1.0 | 1.0 | 2.0 | 1.0 | 2.0 |
| Repetitive (Constant Temperature) | ±0.5 | ±0.5 | ±1.0 | ±0.5 | ±1.0 |
| 6. DX-2012M Silicon Steel Material Automatic Measurement System Reference Configuration |
● DX-2012 Magnetic Material Automatic Test System V1.0 — Set DX-2012M Silicon Steel Material Test Master Unit - One Unit ● Standard Epestan Square Circle One (optional) ● Single Silicon Steel Permeability Meter One (optional) Lenovo Brand Computer (Industrial Control Computer) - One Unit (Optional) HP Laser Printer - One (optional) ● Third-party Certified Silicon Steel Sheet Sample — One (Optional) Standard cabinet and workbench - one unit (optional) CDs and manuals - a set The above configuration list is for reference only; please consult a sales representative for the actual configuration. |
About Us

Xiamen Yinde Xingmagnet Technology Co., Ltd. was established in 2008, located in the beautiful city of Xiamen, Fujian Province, China, which is also an international seaport. Yinde Xingmagnet is a high-tech enterprise with comprehensive services in the international magnetic measurement industry. The company boasts a team of experienced technical personnel in the magnetic measurement field and collaborates with universities and research institutions at home and abroad, providing global customers with precise measurement equipment systems and excellent after-sales service.
Our primary equipment and measurement systems developed by the company include: digital teslameter/gaussmeter, fluxmeter, Hall effect sensor, Helmhotz coil, electromagnet, permanent magnet for nuclear magnetic resonance, precision current source, phase-locked amplifier, weak magnetic shielding system, AC/DC magnetic field control system, new energy metering system for magnetic flux, multi-dimensional magnetic field testing system, permanent magnet material measurement system, vibration sample magnetometer, etc.

Manufacturing Facility

Berlin Trade Show

All products from Xiamen Yinde Xing are customizable, welcome to inquire!
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