Tudu (Shanghai) Testing Technology Co., Ltd.VIP

光谱仪、相控阵、超声探伤仪、内窥镜
Enter Shop

BondMaster 600 - Bonding Analysis Instrument for Composite Honeycomb Structure Mechanical Impedance Mode

平台认证
  • Unit Price

    $5000.00/Set

  • Brand

    Olympus/Olympus Corporation

  • MOQ

    1Set

Contact
Leave Msg

Platform Service

Supplier Verified



途度(上海)检测科技有限公司

VIP   数字营销第4年
资料通过中商114认证
Category
  • No Category

Product Details

Specs

Gallery

  • Brand:

    Olympus/Olympus Corporation

  • Unit Price:

    $5000.00 / Set

  • MOQ:

    MOQ1Set

  • Total:

    10000Set

  • Address:

    Shanghai

  • Delivery:

    3days

  • View More

Description

BondMaster 600 Multi-Mode Adhesive Inspection Device – Mechanical Impedance Analysis (MIA) and Probe


BondMaster 600 Portable Adhesive Inspection Device features a 5.7-inch VGA display, which becomes brighter and clearer when switching to full-screen mode. Regardless of the display mode or detection method being used, simply click the full-screen mode switch button to activate full-screen mode.The ndMaster 600 bonding tester is equipped with various standard testing methods, including single transmit/receive RF, single transmit/receive pulse, single transmit/receive sweep, resonance, as well as the significantly improved mechanical impedance analysis (MIA) method.


Mechanical Impedance Analysis (MIA) method can measure the mechanical impedance of materials, i.e., the material's stiffness. The MIA probe emits a fixed, audible frequency. Changes in material stiffness are represented as BoSignal amplitude and phase changes in the X-Y view of the ndMaster 600 instrument.


Mechanical impedance analysis mode uses a small tip probe, with BondMaster 600 instrument's high-performance electronic devices, when combined, simplify the operation of detecting small-scale debonding in cellular composite materials, compared to other detection methods. Additionally, BoThe ndMaster 600 instrument expands the frequency range for mechanical impedance analysis (from 2 kHz to 50 kHz), allowing for a vast array of results, even for delamination defects on the far side.


BondMaster 600 instrument features a simple mechanical impedance analysis calibration wizard, which guides users in selecting the appropriate frequency for detecting smaller defects in cellular composite structures and other hard-to-find defects.


Mechanical Impedance Analysis Probe Characteristics:

  • Ideal for debonding the skin and core of cellular composite materials.

  • Effectively detects delamination under core chipping conditions.

  • Highly sensitive to minor defects.

  • Easily identify the repair (casting seal) areas on adhesive failure defects.

  • Suited for continuous scanning.

  • We offer various probe housings.

  • No coupling agent required.

        


Mechanical Impedance Analysis Probe Technical Specifications

S-MP-3 Technical Specifications

Operation Mode: MIA (Mechanical Impedance Analysis)

Probe Design: Right-angle probe, spring-loaded requires BMM-H

End: 12.7mm end diameter

Detection Capabilities: Detects defects in the Graphite Composite skins bonded to Nomex honeycomb structures; skin thickness from 2 to 7 layers. Defect size: 25.4 mm x 50.8 mm; from 2 to 18 layers. Defect size: 12.7 mm or larger.


Typical Applications

  • Detects irregular or curved surfaces.

  • Suitable for detecting skin-core delamination, broken cores, and other typical skin-core bonding defects.

  • Suitable for continuous or mechanical scanning by applying spring-loaded or constant pressure at the probe tip.


S-MP-4 Technical Specifications

Operation Mode: MIA (Mechanical Impedance Analysis)

Probe Design: Right-angle probe, spring-loaded requires BMM-H

End: 6.35mm end diameter

Detection Capability: Capable of detecting defects in a metal-to-metal bond layer as thick as 2mm, with detectable defect sizes of 6.35mm or larger; and detecting defects on glass fiber skins bonded to foam cores with a maximum thickness of 6.35mm, with detectable defect sizes of 12.7mm or larger.


Typical Applications

  • Detectable of irregular or curved surfaces

  • Suitable for detecting delamination of the sheath and core, broken cores, and other typical bonding defects between the sheath and core.

  • Suitable for continuous or mechanical scanning by applying spring-loaded or constant pressure at the probe tip.

S-MP-5 Technical Specifications

Operation Mode: MIA (Mechanical Impedance Analysis)

Probe Design: Right-angle probe, adjustable spring tension

End: 12.7mm end diameter

Detection Capability: The tension of the spring-loaded internal mechanism can be adjusted across 3 levels to enhance consistency and accuracy. Particularly suitable for suspended detection. Equipped with a removable Delrin wear plate.


Typical Applications

  • Detectable of irregular or curved surfaces

  • Suitable for detecting skin-to-core delamination, broken cores, and other typical skin-to-core bonding defects.

  • Applicable for continuous or mechanical scanning by utilizing spring-loaded or constant pressure at the probe tip.


BMM-H probe housing


Typical Applications

For S-MP-03 and S-MP-4 probes. Ensure constant pressure is applied to the workpiece. While maintaining the probe perpendicular to the detection surface, it also significantly enhances stability. Includes a Teflon wear plate and a spring-loaded probe holder.








S-MP-1 Technical Specifications

Operation Mode: MIA

Probe Design: Right-angle probe, unloaded spring

End: 12.7mm end diameter

Detection Capability: Detects defects in the composite skin of graphitic materials bonded to a cellular structure.


Typical Applications

  • Detects irregular or curved surfaces.

  • Ideal for detecting adhesive failures between the jacket and core, broken cores, and other common jacket-core bonding defects.

  • Can detect in hard-to-reach areas.


S-MP-2 Technical Specifications

Operation Mode: MIA

Probe Design: Straight probe, no spring loaded

End: 6.35mm end diameter


Typical Applications

  • Detects irregular or curved surfaces.

  • Ideal for detecting adhesive failure, core cracking, and bonding defects in the inner wall of composite material structures.

  • Can detect in hard-to-reach areas.



Mechanical Impedance Analysis (MIA) Cable

SBM-CPM-P11


BondMaster Cable: 11-pin to 11-pin cable, designed for single transmit and receive probe applications and Mechanical Impedance Analysis (MIA) probes, 3.3 meters in length.


Disclaimer:Info provided by user, user liable for authenticity, accuracy & legality. Zhongshang114 assumes no liability.

Tip:Confirm supplier qualification & quality before purchase to avoid risks.

Unit Price $5000.00 / Set
Sales None
Delivery Shanghai3dayswithin
Stock 10000SetMOQ1Set
Brand Olympus/Olympus Corporation
Product Features MIA probe
Is Importing No
Origin Canada
Expiry Long Valid
Update 2022-11-30 17:07
Gallery

Tudu (Shanghai) Testing Technology Co., Ltd.Published byBondMaster 600 - Bonding Analysis Instrument for Composite Honeycomb Structure Mechanical Impedance ModeGallery Lib

Contact Merchant



Join

Successful Enterprise Join, Enjoy Multiple Privileges

Join Hotline:4006299930

Please scan with mobile phone

Customer Service

Service Hotline:4006299930

Official Account

WeChat Official Account, Get Business Opportunities

Scan to follow WeChat

Top