Desktop X-ray Diffraction Instrument
Designed for industrial production and quality control, the advanced technology of a concentrated X-ray diffractometer, a functionalized and miniaturized desktop X-ray diffractometer. Capable of precise qualitative analysis, quantitative analysis, and crystal structure analysis of metal and non-metal samples. Particularly suitable for manufacturing industries such as catalysts, titanium dioxide, cement, pharmaceuticals, and more.
Main Technical Specifications:
● Operating Power (Tube Voltage, Tube Current): 600W (40kV, 15mA) or 1200W (40kV, 30mA), Stability: 0.005%
● X-ray Tube: Metal-Ceramic X-ray Tube, Cu Target, Power: 2.4kW, Focal Size: 1x10 mm
Air-cooled or water-cooled (water flow rate greater than 2.5L/min)
● Angular Measuring Instrument: Sample horizontal θs-θd structure, diffraction circle radius 150mm
●Sample Measurement Methods: Continuous, Step, Omg
●Angle Measurement Range: -3° to 150° when θs/θd联动
● Minimum Step Width: 0.0001°
● Angle Reproduction: 0.0005°
● Angular positioning speed: 1500°/min
Counter: Enclosed proportional or high-speed one-dimensional semiconductor counter
● Spectrum Resolution: Less than 25%
● Maximum linear counting rate: ≥5×10^5 CPS (proportional), ≥9×10^7 CPS (one-dimensional semiconductor)
● Computers: Dell Commercial Laptops
●Instrument Control Software: Windows 7 operating system, automatically controls the tube voltage, tube current, shutter, and aging training of the X-ray generator; controls the goniometer for continuous or step scanning while simultaneously collecting diffraction data; performs routine processing of diffraction data: automatic peak finding, manual peak finding, integrated intensity, peak height, centroid, background subtraction, smoothing, peak shape amplification, and spectrum comparison, etc.
● Data processing software: phase qualitative and quantitative analysis, Kα1, α2 deconvolution, full spectrum fitting, peak fitting, half-width at half-maximum and grain size calculation, unit cell determination, second-order stress calculation, diffraction line indexing, multi-drawing, 3D drawing, diffraction data calibration, background subtraction, quantitative analysis without standard samples, full spectrum fitting (WPF), XRD diffraction spectrum simulation.
● Scatter radiation protection: Lead + lead glass shielding, interlocked with light shutter windows and protective devices, scatter radiation measurement not exceeding 1 μSv/h
Instrumental overall stability: ≤1‰
● Sample Load Data: Configure the sampler, with a maximum of 6 samples per load
