Product Overview

The 6317 series tunable laser sources are domestically produced high-performance Littman external cavity types with picometer-level wavelength positioning accuracy, covering a wavelength range of 1240nm to 1680nm. They offer excellent repeatability in wavelength and power output with a wide dynamic range. While performing rapid wavelength scanning, they can simultaneously output a triggering level signal with extremely high wavelength accuracy, efficiently testing the wavelength-related characteristics of photonic chips and devices in the field of optical communications, such as silicon optical chips, filters, and wavelength selectors (e.g., IL, PDL). The narrow linewidth feature, combined with the function of non-jumping mode wavelength continuous scanning, helps achieve highly ideal spatial resolution and positioning accuracy for optical frequency domain reflectometers (OFDR). The 6317 series tunable laser sources are advanced in performance and cost-effective, serving as internal core excitation sources for various high-end photonic testing instruments/systems. They can also be used as general-purpose light sources in university laboratories, corporate R&D centers, and calibration and metrology institutions, empowering researchers in the optoelectronics industry.