High Accelerated Stress Test (HAST)

Brief Introduction: The purpose of accelerated life testing is to increase environmental stresses (such as temperature) and working stresses (such as voltage and load applied to the product), expedite the testing process, and shorten the life test time for products or systems. It is used to investigate and analyze the occurrence of electronic components and mechanical parts wear and service life issues, the shape of the failure distribution function of service life, and the reasons for the increase in failure rate.

Application Fields: IC semiconductors, connectors, printed circuit boards, magnetic materials, high polymer materials, EVA, photovoltaic components, etc.
Key Instrument: High Accelerated Stress Test (HAST) Chamber
Reference Standards: GBIT 2423.40, IEC 60068-2-66, JESD 22-A102, etc.