White Light Interferometer
White light interference measurement is specifically designed for non-contact rapid measurement, focusing on the surface roughness, flatness, surface defects, wear conditions, corrosion status, porosity, contour shape, and stage difference dimensions of critical areas in precision parts. Its measurement accuracy can reach the nanometer level!
Technical Features
White light interference is a widely used three-dimensional surface topography measurement technique, with longitudinal resolution reaching sub-nanometer levels.
Field information collection and data processing are carried out simultaneously, with short time for high-altitude information collection over large areas.
Commonly used in scientific research and quality management, typical applications include 3D surface topography measurement of samples with different surface roughness (such as wafer structures, mirror, glass, and metal), step height determination, and curved surface accuracy measurement (such as micro-lenses).
The Smart Series White Light Interferometry 3D Profiler innovatively integrates white light interferometry technology, with the independently developed SmartWLI software capable of monitoring and controlling the entire measurement process.
The core algorithm is based on long-term research and measurement experience, featuring high efficiency, stability, and precision.
SmartWLI software for morphometry, enabling direct interface output of 3D data to MountainsMap image morphology software, which includes file preparation for MountainsMap image morphology software, used for image processing, data analysis, and report generation.
Wide range of application areas:

White Light Interference Advantages:
1, Non-contact measurement Non-contact 3D surface profile measurement.
2, Good reproducibilityLow noise, excellent repeatability in measurement.
3, Nano-resolutionZ-axis resolution up to 0.1nm
4, High point cloud quantityHigh point cloud density: a single surface can reach up to 5 million points.
5, XY resolution smallSmall dot pitch, high XY resolution, capable of high-precision measurement over a large range.
6, Wide field of viewMultiple field of view options available, quick switching of objective lenses for varying fields of view.
7, Measurement speedFast data collection, processing, and output speed.
8,AvailableOnline Measurement:Fast measurement speed, capable of online high-speed detection.
9, Excellent angular characteristicsBeyond traditional angle limits, capable of measuring products with larger tilt angles; diffuse reflective surfaces can be measured on near-90-degree slopes.
10,SoftPowerful pieceThe powerful analysis software features of MountainsMap's software package can be used for complex measurement tasks such as roughness, surface structure, microgeometry, and contours. Automation offers various options: SDK, I/O modules, and several industrial production line solutions.































