Data acquisition and analysis software for phased array detectionTOMNVIEW
Robust design and data collection softwareFlexible Phased Array Configuration
The TomoView Advanced Calculator is an indispensable powerful component within the TomoView software suite. This calculator utilizes pre-programmed wedges, probes, and material databases to easily and accurately program angle beam and focus points for 1-D linear arrays, 1-D circular arrays, and 2-D rectangular array probes.
Advanced calculators can be used to program sector, linear, and depth scan focusing rules for planar and circular geometries. They support dynamic depth focusing (DDF) and can also generate focusing rule files (.law) compatible with OmniScan.
Additionally, the images of the obtained beam and angular beam provide an important verification tool. The "Acoustic Field Simulation Module" is an optional feature that offers simulation of the spatial scattering field in both 2-D and 3-D views.
TomoScan FOCUS LT unleashes the potential of TomoView.
When used in conjunction with Olympus' FOCUS LT, TomoView software becomes even more powerful. Software performance includes:
Utilizing FOCUS LT 64:128 and 64:64 modules, each focusing rule can accommodate up to 64 chips, offering enhanced defect definition, material penetration, and versatility for both 2-D matrix probes and 2-D dual crystal matrix probes.
Advanced R-O configuration with the capability to emit pulses and receive signals using different chip configurations.
High PRF (Pulse Repetition Frequency), suitable for applications requiring rapid detection.
DDF (Dynamic Depth of Focus) significantly enhances resolution while maintaining optimized detection speed.
A maximum of 5 gates can be used (1 synchronous gate, 4 detection gates).
Utilizing TomoView allows for the simultaneous management of up to 3 FOCUS LT devices, thereby maximizing a 3-fold increase in acquisition speed.
Advanced Display Configuration ToolFully configurable views and readings
TomoView offers great flexibility in building layouts, allowing for full customization of view display and readings. Each view group maintains its own content configuration, which can be easily transferred to other views and then saved into layout groups accessible at any time via the TomoView manager.
Create Your Own Readings
In addition to providing various readings, all readings can be easily exported to Microsoft Excel for processing with custom calculation methods, and then re-imported into TomoView. This method allows you to create custom readings and directly import them into the TomoView interface.
Easy and quick setup modifications and multi-group layout management
The TomoView Manager is arguably the most useful TomoView component, as it allows you to quickly and easily access commonly used commands.
It allows for quick addition, deletion, or modification of groups, and offers a seamless switch between different groups and gates. The interface also provides easy adjustment of overall gain, A-scan, and gate parameters.
The flexible and comprehensive layout configurations are fundamental components of TomoView. These layouts allow you to view data presented in various forms, ensuring better alignment with your application needs.
TomoView's standard configuration includes multiple useful predefined layouts. TomoView also allows you to create custom layouts, which you can easily modify, save, and load during the detection and analysis process for quick retrieval. Individual views can also be customized via the context menu, further enhancing the flexibility of managing multiple layouts.
Flexible Setting Optimization Tool -- Trigger Sequence Tool
Ghosting waves caused by high PRF Interlaced scanning can eliminate ghosting waves
In applications where a high detection speed is required and a focus configuration enhancement is needed, the TomoView Trigger Sequencer module can alter the order of the focus rule triggering. This approach helps to minimize the ghost waves that are prone to occur under these conditions.
Dynamic Depth of Field (DDF)
Below is Dynamic Depth of Focus (DDF), and on the right is Standard Focus.
Dynamic Depth Focusing (DDF) technology dynamically alters the formation of the sound beam during signal reception to achieve higher resolution, thereby improving the resolution of defect display while maintaining optimized detection speed.
Condition A Scan
Activated Condition A scan; it records only when an alarm is triggered. This way, only areas with important information contain the A scan, enabling larger areas to be scanned in a single detection.
