XRD-XRF Integrated Analyzer (Model AL-Y3500xrdf)

The AL-Y3500xrdf instrument is a high-end analytical equipment that integrates X-ray diffraction technology (XRD) and X-ray spectroscopy technology (EDS). It is primarily used for elemental composition analysis and structural characterization of materials. With a single measurement, it can simultaneously obtain critical information such as the material's elemental composition, crystal structure, phase composition, and grain size. It is widely applied in fields like materials science, geology, physics, chemistry, biology, semiconductor technology, catalyst characterization, metallographic analysis, and nanotechnology.

● High-Efficiency Integration: Obtain diffraction and spectral data simultaneously with a single measurement, avoiding the time-consuming and error-prone step-by-step measurement of traditional methods.

●High sensitivity and accuracy: Utilizing advanced detectors and algorithms, detection limits are as low as ppm level, with structural analysis precision reaching atomic level.

● Multi-functional Expansion: Various functional accessories cater to diverse testing needs, supporting multiple sample shapes (powder, solid, film, etc.). Compatible with high/low temperature and high-pressure special environment testing, the X-ray generator control system offers high stability, achieving more consistent repeatable measurement accuracy.

● Hardware Integration: Shares X-ray source, sample stage, and control system to ensure optical path synchronization and signal matching between the two technologies.

● Data Fusion: By using dedicated software to jointly analyze diffraction patterns and spectral data, integrating crystal structure information from X-ray diffraction (XRD) with elemental composition data from X-ray fluorescence spectroscopy (XRF), we achieve comprehensive characterization of the substance in all dimensions.

●Identification of one or more phases in unknown samples, capable of analyzing up to 40 elements simultaneously.

● Employed multi-rectifier and Soraa slit system, featuring proprietary intellectual property patents.

● Crystal structure analysis (Rietveld analysis), including basic parameters within the software, empirical coefficient methods, etc.

● Crystal structure changes under unconventional conditions (high and low temperatures), capable of accommodating various sample platforms.

● Film sample analysis, including film phase, multilayer film thickness, surface roughness, and charge density.

● Analysis of micro-area samples, metal material texture, and stress analysis.