Desktop 2D X-ray Diffraction Instrument
The AL-Y500 diffractometer is a newly launched desktop two-dimensional X-ray diffractometer by Aolong Group. It features fixed照相 with a detector, distinguishing it from traditional scanning diffractometers. It is equipped with a X-ray area array photon counting semiconductor detector, compatible with point, line, and surface 0D, 1D, and 2D modes.
Primarily used for phase identification and quantitative analysis of polycrystalline samples, including quantitative analysis without standards, crystallinity determination, crystal structure analysis, material structure analysis, grain size measurement, structural refinement, micro-area analysis, and film and texture stress analysis. Suitable for various fields and industries such as minerals, pharmaceuticals, chemicals, metals and alloys, building materials, nanomaterials, batteries, food samples, and biological samples.
Instrument Features:
● Fixed camera probe, differing from traditional scanning diffractometers, the photographic mode is efficient and quick, approximately 5-30 times faster than scanning mode, suitable for in-situ analysis, collecting diffraction information from all angles simultaneously; high energy resolution, effectively reducing the fluorescence background.
●θs, θd Angle Gauge with servo motor drive and optical encoder control technology; the detector can move along the 2θ axis in dual positions, resulting in smoother rotation of the angle gauge, more accurate diffraction angle measurement, and better linearity. The sample rotates along the θ axis with control precision of 0.01° and ±0.02° accuracy for the 2θ axis angle.
● Composed of multiple detector unit elements, the detector assembly is evenly and uniformly fixed along the diffraction circle, providing seamless full-angle coverage; a double-layer 21-patch (or single-layer 10-patch) area array detector covers the 2θ range of -3° to 150°, enabling 2D imaging while simultaneously collecting γ angle information and providing two-dimensional diffraction data for richer information.
● X-ray area array photon counting semiconductor detector with high sensitivity, capable of single photon counting, wide dynamic range, dual threshold; compatible with point and line light sources, featuring Debye-Scherrer and BB optical geometry, suitable for flat and cylindrical samples, and compatible with 2D, 1D, and OD detection modes. Also resistant to strong radiation and long-term exposure, with a long service life.
● The scatter radiation protection device is safer and more reliable; during sample measurement, the radiation protection door automatically prevents opening, ensuring that operators are not exposed to scatter radiation in any situation.
● Compact size for installation on lab tables; no specific lab environment required; simple in use, operation, and maintenance.
