Stress Birefringence System PA Series

PA Series is PhotoNic Lattic employs its proprietary photonic crystal technology for measuring systems of low-stress birefringence in glass, SIC wafers, sapphire, and other materials, providing the stress birefringence size and distribution of the tested product in seconds.

Product Description

PA Series is Photonic Lattice, Inc. developed optical measuring equipment for transparent materials with high birefringence, utilizing a core polarized image sensor.

Quick and accurate measurement of birefringence in transparent materials is available, with matching models for various product sizes.

Key Features

Rapidly and automatically measure the size, direction, and distribution of birefringence stress.

Face measurement, capable of measuring all data of samples within the field of view in one go

Equipped with point, line, plane, and 3D analysis functions

5 megapixels, high resolution capability

Outputted values: Optical Path Difference (nm), Polarization Angle (°), Stress (Mpa), Birefringence Stress (nm/mm)

Technical Specifications

Measurement Case