Stress Birefringence System PA Series

The PA series is the PhotoNic Lattic utilizes its proprietary photonic crystal technology for measuring systems of low-stress birefringence in glass, SIC wafers, sapphire, etc., providing the stress birefringence size and distribution of the tested product in seconds.

Product Description

PA Series is PhotoNic Lattice, Inc.'s optical measurement equipment developed for transparent materials with high birefringence, utilizing a core polarized image sensor.

Rapid and accurate measurement of birefringence in transparent materials is available, with models to match various product sizes.

Key Features

Rapidly and automatically measure the size, direction, and distribution of birefringence stress

Face measurement, capable of measuring all data for samples within the field of view in one go

Point, line, surface, and 3D analysis capabilities

5.0 megapixels, high resolution capability

Output: Optical path difference (nm), polarization angle (°), stress (Mpa), stress birefringence (nm/mm)

Technical Specifications

Measurement Case