DX-Hall-06 Hall Effect Test System

Testable samples:

1. Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe, ferrite materials, etc.

2. Low Impedance Materials: Graphene, Metals, Transparent Oxides, Weakly Magnetic Semiconductor Materials, TMR Materials, etc.

3. High-impedance materials: semi-insulating GaAs, GaN, CdTe, etc.

Composition of the Hall System:

The system consists of: electromagnet, high-precision power supply, connecting cables, high-precision constant current source, high-precision voltmeter, gaussmeter, standard samples, sample mounting racks, and system software. The DX-320 effect instrument, specially developed for this system, integrates a constant current source, a six-and-a-half-digit microvolt meter, and a complex Hall measurement relay into one unit, greatly simplifying the wiring and operation of the experiment. The DX-320 can be used independently as a constant current source and a microvolt meter. It is used to measure important parameters such as carrier concentration, mobility, resistivity, Hall coefficient, of semiconductor materials, which are essential for understanding the electrical properties of semiconductor materials. Therefore, the Hall effect testing system is an indispensable tool for understanding and studying the electrical properties of semiconductor devices and materials. The experimental results are automatically calculated by the software, providing data on bulk carrier concentration, surface carrier concentration, mobility, resistivity, Hall coefficient, magnetoresistance, and more.

Key Parameters:

1. Magnetic Field Strength: Greater than 7,000 Gauss (DX-50), greater than 14,000 Gauss (DX-100), air gap 15mm

2. Current: 0.1mA - 50mA (expandable up to 1A)

3. Voltage Measurement: 0.1uV - 3V

4. The provided standard sample materials: GaAs, Si, etc.

5. Minimum magnetic field resolution: 0.01 mT

6. Magnetic Field Measurement Range: 0-3T

7. Resistance Range: 10mΩ - 1MΩ

8. Carrier Concentration: 10³-10²²cm^-3

9. Migration Rate: 0.1-10⁸cm²/volt*sec

10. System Measurement Error: <2%

11. Measure communication with a Gauss meter or data acquisition board

12. I-V and I-R curve tests

13. Resistance range: 10^-5-10⁷ohm*cm

14. Resistance Range: 10mΩ - 1MΩ

15. Carrier Concentration: 10³-10²²cm^-3

16. Migration Rate: 10²-10⁷cm²/volt*sec

17. Fully automatic testing, one-piece processing

About Us

Xiamen Yinde Xingcetech Magnetoelectric Technology Co., Ltd. was established in 2008, located in the beautiful city of Xiamen, Fujian Province, China, which is also an international seaport. Yinde Xingcetech is a high-tech enterprise with comprehensive services in the international magnetic measurement industry. The company boasts a team of experienced technical personnel in the magnetic measurement field and collaborates with universities and research institutes at home and abroad, providing precision measurement equipment systems and excellent after-sales service to customers worldwide.

The main equipment and measurement systems developed by our company include: digital teslameter/ gaussmeter, fluxmeter, flux gate meter, Helmholz coil, electromagnet, nuclear magnetic resonance permanent magnet, precision current source, phase-locked amplifier, weak magnetic shielding system, AC/DC magnetic field control system, new energy meter magnetic measurement system, multi-dimensional magnetic field testing system, permanent magnet material measurement system, vibration sample magnetometer, etc.

Manufacturing Facility

Berlin Trade Show

All products from Xiamen Yinde Xing are customizable. Welcome to inquire!

Submit your requirements, and we will tailor a solution for you.