SWT-608Type Full Automatic Brake Disc Tester

Instrument Introduction:

SWT-608Type Full-Automatic Brake Disc Tester, equipped with a mature eddy current detector in the current flaw detection field, combinedPLCTechnology, analog electronics, digital electronics, and sensor technology enable fully automatic detection of defects such as cracks, sand holes, and pores on brake discs.

SWT-608The type automatic brake disc tester is installed on the brake disc manufacturing and inspection line, capable of high integration with other equipment, participating in the manufacturing and inspection process of brake discs.

Features:

1Touchscreen with statistical function; downloadable data, traceable product quality

2Equipped with a probe alarm, which can trigger an alarm in case of a probe failure.

3Industrial-grade flaw detection main units and recorders, equipped with industrial air conditioning, for long-term and stable reliable operation.

4The mainframe cabinet comes with adjustable feet, making it more suitable for the rainy and humid climate in the south, where maintenance staff can avoid bending over.

Instrument specifications:

    1Frequency Range:64 Hz～2 MHz

    2Gain:0～48dBStep0.5dB

    3Phase Rotation:0~360Stepping 1 °

    4Gain RatioY/X）：0.1~10

    5、Internal and external clock-controlled synchronous alarm output

    6、High-precision end head and end tail signal truncation function

    7、High-precision real-time and delayed alarm outputs

    8、Non-linear phase/amplitude alarm zone

    9、Full digital parameter adjustment for computers

    10、Hard disk and SSD storage signal detection and reproduction

    11Rapid Digital/Simulated Electronic Balance

    12Memory trace delay fade function

    13Menu-driven Human-Machine Dialogue (Chinese & English Versions)

    14Broadband digital filtering suppresses the impact of speed variations on signal amplitude, making it highly suitable for manual or automated flaw detection.

    15Automatic signal amplitude, phase measurement, eddy current detection signal slow (adjustable) replay and extended analysis function

    17Built-in Fault Identification Chip for Probes

Work Environment:

    Operating Temperature:-15~55℃

    Storage Temperature:-20~60℃

    Relative Humidity: Not exceeding85%

Working Voltage:AC220±10V

Inspection Corner:

Inspection Corner: