The CNK-2000 Automatic Fluorescent Magnetic Particle Inspection Machine features a mechanical and electrical separation multi-combination structure. The electrical control system and mechanical bed are independently separated, primarily using automatic identification methods to inspect crack defects on the outer surface of workpieces in any direction. The equipment is composed of several major parts, including the electrical control system, power supply system, magnetic particle inspection main system, automatic identification system, automatic material handling system, and degaussing system. The magneticization system employs a direct clamping electromagnetic method for circumferential magnetization and a coil induction method for longitudinal magnetization, achieving a one-time composite magnetization for comprehensive inspection of various cracks and minute defects on the surface and near-surface of workpieces.