Basic Accuracy

Basic Accuracy +/-0.8%

Scanning Frequency Range: 1 MHz to 3 GHz

Oscillator Level: Up to 1 dBm/0.5 Vrms/10 mArmsDC

Offset Level (Option E4991A-001): +/- 40V or +/- 50 mA

More Features

Windows-style user interface

Built-in VBA programming feature

Data transmission via LAN interface

Multi-functional Measurement

- Optional Dielectric/Magnetic Material Measurement (Option E4991A-002)

- Reliable Wafer Measurement (Option E4991A-010)

Temperature Characteristic Measurement (Option E4991A-007)

E4991A offers superior impedance measurement performance and powerful built-in analysis features for radio frequency impedance/material analysis.

It offers innovative features for measuring components and circuit designs within 3 GHz, aiding engineers in their R&D work.

Unlike reflective measurement technology, the E4991A employs RF current-voltage (RF-IV) technology, offering impedance measurement results across a wide range of impedances.

Basic impedance accuracy is +/-0.8%. High Q accuracy is beneficial for low-power component analysis.

The built-in synthesizer features a scanning range of 1 MHz to 3 GHz with a resolution of 1 mHz.

Material Assessment

E4991A offers a comprehensive dielectric/magnetic material measurement solution, covering a wide frequency range from 1 MHz to 1 GHz.

Utilize the E4991A-010 probe station adapter kit to easily connect the Keysight E4991A to the RF probe system (provided by Cascade Microtech) for wafer measurements.

Temperature Characteristic Evaluation

The Temperature Characterization Kit E4991A-007 is a new solution for measuring temperature characteristics of components and materials.

This option offers high-precision temperature characteristic analysis and robust temperature drift compensation across a wide temperature range of -55°C to +150°C.