The SE-1000 spectroscopic ellipsometer is a multifunctional thin film testing system suitable for the study of various thin film materials.
The SE-1000 ellipsometer, while maintaining the same accuracy and flexibility as the SE-2000 in testing, is equipped with a manual angle measuring instrument and a manually movable sample stage, providing customers with a cost-effective ellipsometer testing platform. In addition, the SE-1000 spectral ellipsometer adopts newly designed optical components and a new version of testing and analysis software, greatly improving the operational stability and data processing capabilities of the equipment.
Like the SE-2000 platform, the SE-1000 spectroscopic ellipsometer is also a multifunctional testing platform that adopts a modular design. It can integrate various functions such as FTIR infrared spectroscopy testing module, eddy current non-contact or 4PP contact block resistance testing module, Mueller Matrix anisotropic material testing module, Raman crystallinity testing module, electron mobility characterization module, LBIC photo induced current testing module, reflection interference testing module, etc. Users can choose the appropriate combination of functions according to their testing needs.
Product Features
The industry's first manufacturer of spectroscopic ellipsometer testing equipment
Industry standard testing institutions calibrate equipment and participate in the release of the technical standards for ellipsoidal polarization testing in the People's Republic of China
Designed for research and laboratory testing, it can reduce testing costs
Modular design, capable of comprehensively monitoring the optical and electrical characteristics of samples
Regularly upgrade SOPRA material database for free
Open optical model fitting analysis process, convenient for users to optimize testing menu
Main applications
The industry's first manufacturer of spectroscopic ellipsometer testing equipment
Industry standard testing institutions calibrate equipment and participate in the release of the technical standards for ellipsoidal polarization testing in the People's Republic of China
Designed for research and laboratory testing, it can reduce testing costs
Modular design, capable of comprehensively monitoring the optical and electrical characteristics of samples
Regularly upgrade the material database for free
Open optical model fitting analysis process, convenient for users to optimize testing menu
Main technical indicators
Manual angle range: 45 ° -90 °
Spectral range: 245-990 nm
Larger sample size: 200 mm

Thickness measurement range: 0.01nm-50um (depending on sample type)