CIT-3000SMK Energy Dispersive X-Ray Fluorescence Analyzer

Instrument Overview

For the technical challenge of measuring trace silver elements in mine tailings, Sichuan Xinxianda Measurement and Control Technology Co., Ltd. has proposed a rapid detection method based on the principle of ultra-short optical path for energy-dispersive X-ray fluorescence spectrometry. This method enhances element measurement resolution, improves sample analysis efficiency, reduces the power of the optical tube, and extends the service life of the instrument. The instrument's energy spectrum system optimizes the design of filters and shielding materials for detectors, meeting the detection requirements for trace silver elements. In actual tailings testing, the detection limit for silver can reach 0.1 mg.kg-1.

Actual product photo

Measurement Principle Diagram

Technical Specifications

Supply Voltage: AC 220V ±10%, 50Hz ±0.2Hz

Anode Tube Voltage: adjustable from 0-65kV

X-ray Tube Current: adjustable from 0-1mA

Detector: SDD detector, resolution better than 135eV (@5.89KeV)

Whole machine resolution better than 89eV (@5.89KeV)

Calibration Method: Utilizes standard sample calibration curve.

Powder compression measurement object status: Powder tablet.

Instrument rated power: 100W

Operating Environment Temperature: 0-40 °C

Ø Environmental Humidity: ≤80%

Detection Limit: 0.1 ppm

Precision: ≤5%

Instrument Dimensions: 500(D) x 440(W) x 340(H) mm

Instrument weight: ≤50kg

Testing Time: 2~5 minutes quantitative test.

Performance Features

Utilizing the state-of-the-art electrically cooled silicon drift Fast-SDD semiconductor detector, offering a wide range of analyzed elements and high resolution.

Utilizing full digital spectrum analysis technology, offers high counting rates, no missed counts, and excellent stability.

The X-ray tube excites the sample, which is non-radioactive, non-toxic, and free of pollution. It has obtained a safety exemption from the national environmental protection department, ensuring safety and reliability.

Unique ultra-short optical path design enhances element measurement resolution, improves sample analysis efficiency, reduces optical tube power, and extends the instrument's service life.

The detection limit for trace silver elements can reach 0.1 ppm.

Open-platform calibration for work curve, customizable analytical and control solutions for materials.

Full Chinese Windows application software, easy to operate.

User-friendly design, integrated structure, adaptable to various environments, continuous operation for 24 hours, low failure rate.

Strict database management system, supporting historical data queries.

Actual spectrum graph