ME500 Inverted Bright Field Metallographic Microscope

On-site/Polarized Light/Differential Interference/Encoding/Light Intensity Memory/LCD Display

Optical System

OMTOptical System with Infinite Color Difference Calibration45mm

Three-axis observation tube

Infinite focal distance hinge elbow observation tube, pupillary distance adjustment:50mm~75mmSingle-eye diopter adjustment: ±5Diopters, two-stage light split ratioR:T=100：0Or0：100

Eyepiece

High eye point wide field flat field eyepieceCFI 10X22mm(Adjustable Light Transmission)

Objective lens

Bright-field optical objective5x、10x、20x、50x、100x）

5X NA0.15 WD14.8,  10X NA0.3 WD8.5,  20X NA0.40WD11.9,  50X  NA0.75WD3，

100X NA0.90 WD1（100X For selection)

Rack

Polarized slot , WithLCD screen brightness light sourceOcular Magnification Display Function

Objective Converter

5Aperture Coding Bright/Dark Field Objective Converter (with)DICSlot

The coded objective converter integrates the microscope's hardware settings with the Omnitron image analysis software. It displays the magnification of the objective on the screen and automatically adjusts the calibration values recorded in the software when switching magnifications, eliminating measurement errors caused by forgetting to switch the software magnification..

Coarse and fine focusing mechanism

Low-handing coarse fine-tuning coaxial , Coarse travel adjustment9mm, Face up6.5mm, Downward2.5mm, Fine-tuning precision0.002mm, Adjustable handwheel with anti-slip feature

Loading Platform

Dual-layer mechanical moving platform, low hand positionX、YDirectional coaxial adjustment, dual-purpose transparent/refractive glass loading platform

Camera Interface

Photography and video accessories:0.7X  CInterface, adjustable focus;

Additional Attachments

4KHigh-definition imaging systemUSB3.0Computer-based imaging system，Camera500Ten thousand.600Ten thousand.1200Ten thousand.2000Please provide the Chinese content for translation.

High-precision micrometer, graduation value0.01mm

Software (Professional Measurement Systems, Metallographic Analysis Systems, Particle Analysis Systems, Porosity Analysis Systems, Welding Measurement Systems, etc.)