Portable FET-9HP Eddy Current Flaw Detector

PortableFET-9HPEddy Current Testing Instrument

Instrument Introduction:

PortableFET-9HPThe intelligent digital eddy current flaw detector is portable, suitable for online and offline flaw detection of metal tubes, rods, wires, and plates. It can also be used for automatic flaw detection of other mechanical components such as tube inner walls, drill plates, bearing rings, tubes, hole plates, billets, and round billets. It features a relatively independent testing channel, capable of driving a combined probe consisting of differential coils, while simultaneously collecting data in the detection channel to detect cracks and transverse defects in metal components (such as welds), reliably identifying blind holes and hidden cracks.

Feature Highlights:

The signals obtained from the detection channel can be displayed in real-time on the screen as impedance plane graphs and time-base scan graphs. It can accommodate the detection requirements of sheets made from various different metals. Due to its fully digital design, multiple standard detection programs or expert systems can be established within the instrument, facilitating user access when changing product specifications. It is equipped with input/output control interfaces, making it convenient to connect with various equipment at the detection site and work synchronously, forming a highly automated system.

Instrument specifications:

1Inspection Channel:1Expand the channel count as needed.

2Frequency Range:1Hz～15 MHzMeets the testing requirements for various metal materials

3Gain Range:0.1～99.0 dB Continuous adjustable, stepless: 0.1dB

4Phase Rotation:0～359Continuous adjustable, stepless: 1 deg

5Gain Ratio:Y/X）0.1～10.0

6Inspection Speed:0-340m/min

7Adjustable probe drive (excitation) level:1～8 Genuinely "multifunctional" testing

8Quick Digital/Simulated Electronic Balance

9Non-uniform, asymmetric phase alarm area settings

10Multiple display modes: Impedance, Time Base

11Digital Filtering: Low Pass0Hz～2000HzQualcomm0Hz～2000Hz）

12Time-delayed hardware output alarm, real-time hardware output alarm

13Audio-visual alarm output

14Automatic Balance Time:1～1000 Instantly

15Internal and external clock selection

16End-head and end-tail signal cutting function

17Capable of storing a large volume of various testing programs and data

18With the capability to replay eddy current signals, measure the amplitude, phase, and digital values of defects.

19Automatically record the number and location of defects

20Automatically generate test reports (including the number of tests, pass rate, and fail rate)

21Display Method: Solid Line, Dashed Line

22Hidden Display Coefficient:1～100

23Chinese and English operating languages, online help

24Rectangular coordinate system and polar coordinate system background selection

25Automatic Calendar, Time Display

26Battery: Single full charge for use6-8hour

Work Environment:

    Operating Temperature:0-40℃

    Storage Temperature:-20℃-+50℃

    Relative Humidity: Not exceeding85%

Working Voltage:DC12V

On-Site Non-Destructive Testing

    On-Site Inspection