SiliconCore successfully develops an all-in-one testing system for automated IV and capacitance testing of PD chips.

With the launch of 5G communication, there has been a significant surge in demand for PD chips in the upstream of the industry chain, leading to expanded production and testing capacities for PD chip lines. Traditional single parameter testing systems are no longer sufficient to meet the requirements of the production lines.

The retirement of the APS1500-ALL PD chip IV, photoresponse, and capacitance testing system has resolved this challenge. The system features an all-in-one structure, integrating testing instruments, semi-automatic probe stations, spot detectors, ATE software, and image recognition technologies, effectively solving the难题 of automatic screening for PD chips.