26G Radar Level Gauge Product Overview
The 80X series sensors are 26G high-frequency radar level gauges, capable of measuring distances up to 80 meters. The antenna has been further optimized, and the new, rapid microprocessor enables faster signal analysis and processing, making the gauge suitable for use in complex measurement conditions such as reaction vessels and solid material silos.
Principle of 26GHz Radar Level Gauge
The radar level antenna emits a narrow microwave pulse, which is transmitted downward through the antenna. Upon contacting the surface of the medium being measured, the microwave is reflected back and then received again by the antenna system. The signal is then transmitted to the electronic circuitry, which automatically converts it into a level signal (since the propagation speed of microwaves is extremely fast, the time taken for the electromagnetic wave to reach the target, reflect, and return to the receiver is almost instantaneous).
A Range Setting B Low Adjustment C High Adjustment D Blind Area Range
The reference surface for measurement is: the threaded bottom surface or the sealing surface of the flange.
Note: When using radar level timing, ensure that the material level does not enter the measurement blind area (as shown in area D in the diagram).
26G Radar Level Gauge Features:
Small antenna size for easy installation; contactless radar, no wear.
Little affected by corrosion and foam; almost unaffected by changes in humidity, temperature, and pressure in the atmosphere.
The presence of a severe dust environment has little impact on the operation of the high-frequency level gauge.
Shorter wavelength, with better reflection on inclined solid surfaces.
Beam angle is narrow, energy is concentrated, enhancing the echo capability while also benefiting in avoiding interference objects.
Smaller measurement blind spot, also yielding good results for small container measurements.
High signal-to-noise ratio, delivering superior performance even under fluctuating conditions.
High frequency is the ***choice for measuring solids and low dielectric constant materials.
