26 GHz Radar Level Gauge Product Overview
The 80X series sensors are 26G high-frequency radar level gauges with a measuring range up to 80 meters. The antenna has been further optimized, and the new, fast microprocessor enables higher-speed signal analysis and processing, allowing the gauge to be used in complex measurement conditions such as reactors and solid material silos.
26 GHz Radar Level Gauge Working Principle
The radar level antenna emits a narrow microwave pulse, which is transmitted downward through the antenna. Upon contacting the surface of the medium being measured, the microwave is reflected back and then received again by the antenna system. The signal is then transmitted to the electronic circuitry, which automatically converts it into a level signal (since the propagation speed of microwaves is extremely fast, the time taken for the electromagnetic wave to reach the target, reflect, and return to the receiver is almost instantaneous).
A Range Setting B Low Adjustment C High Adjustment D Blind Zone Range
The reference surface for measurement is: the threaded bottom surface or the sealing surface of the flange.
Note: When using radar level timing, ensure that the material level does not enter the measurement dead zone (as shown in area D of the diagram).
26G Radar Level Gauge Features:
Small antenna size for easy installation; contactless radar, no wear.
Virtually unaffected by corrosion and foaming; almost immune to changes in humidity, temperature, and pressure in the atmosphere.
The presence of a severe dust environment has little impact on the operation of the high-frequency level gauge.
Shorter wavelength, better reflection on inclined solid surfaces.
Beam angle is small, energy is concentrated, enhancing echo capability while also being advantageous in avoiding interference objects.
Smaller measurement blind spot, yielding excellent results even for small containers.
High signal-to-noise ratio, delivering superior performance even under fluctuating conditions.
High frequency is the ***choice for measuring solids and materials with low dielectric constants.
