Light and dark field/Polarized Light/Differentiated interferometry/Code/Light Intensity Memory/Screen Display

Optical System

OMTOptical System with Infinite Color Difference Calibration45mm

Three-wayObservation Tube

Infinite focal distance hinge elbow observation tube, pupillary distance adjustment:50mm~75mmSingle-eye diopter adjustment:±5Dioptre, two-stage light splitting ratioR:T=100：0Or0：100

Eyepiece

High Eye Point Wide Field Flat Field EyepieceCFI 10X22mm(Adjustable visibility)

Objective lens

Light and dark scenesMetallographic Objective5x、10x、20x、50x、100x）

5XNA0.15WD14.8,  10XNA0.3WD8.5,  20XNA0.40WD11.9,  50XAPO-NA0.75WD4，

100X APO-NA0.90 WD1（100X For selection (optional)

Rack

With on/off-field switch device , Polarized slot, WithLCD display light source brightnessOptical Magnification Display Function

Objective Converter

5Hole sizingLight and darkField lens adapter (with)DICSlot

The coded objective converter integrates the microscope's hardware settings with the Omnitron image analysis software. It displays the magnification of the objective on the screen and automatically adjusts the recorded calibration values in the software when switching magnifications, eliminating measurement errors caused by forgetting to switch the software magnification..

Coarse and fine focusing mechanism

Low hand position coarse and fine tuning coaxial , Coarse travel adjustment9mm, Face-up6.5mm, Downward2.5mm, Fine-tune precision0.002mm, Adjustable handwheel with anti-slip feature

Cargo Platform

Double-layer mechanical moving platform, low hand positionX、YDirectional coaxial adjustment, dual-purpose transparent/refractive glass specimen platform

Camera Interface

Photography & Video Accessories:0.7X  CInterface, adjustable focus.

Additional Attachments

4KHigh-definition imaging systemUSB3.0Computer Imaging System，Camera500Ten thousand.600Ten thousand.1200Ten thousand.2000Please wait.

High-precision micrometer, graduation value0.01mm

Software (Professional Measurement Systems, Metallographic Analysis Systems, Particle Analysis Systems, Porosity Analysis Systems, Welding Measurement Systems, etc.)