26G Radar Level Gauge Product Overview
The 80X series sensors are 26G high-frequency radar level gauges, capable of measuring distances up to 80 meters. The antenna has been further optimized, and the new, rapid microprocessor enables faster signal analysis and processing, allowing the gauge to be used in complex measurement conditions such as reactors and solid material silos.
26GHz Radar Level Gauge Product Principle
The radar level antenna emits a narrow microwave pulse, which is transmitted downward through the antenna. After contacting the surface of the medium being measured, the microwave is reflected back and then received again by the antenna system. The signal is then transmitted to the electronic circuit section, where it is automatically converted into a level signal (since the propagation speed of microwaves is extremely fast, the time taken for the electromagnetic wave to reach the target, reflect back, and return to the receiver is almost instantaneous).
A Range Setting B Low Adjustment C High Adjustment D Blind Zone Range
The reference plane for measurement is: the threaded bottom surface or the sealing surface of the flange.
Note: When using radar level timing, ensure that the material level does not enter the measurement blind area (as shown in area D in the diagram).
26G Radar Level Gauge Features:
Small antenna size for easy installation; contactless radar, no wear.
virtually unaffected by corrosion and foaming; almost immune to changes in humidity, temperature, and pressure in the atmosphere.
The severe dust environment has little impact on the operation of the high-frequency level gauge.
Shorter wavelength, with better reflection on inclined solid surfaces.
Beam angle is small, energy is concentrated, enhancing the echo capability while also aiding in avoiding interference objects.
The measuring blind zone is smaller, resulting in good measurement effects even for small containers.
High signal-to-noise ratio, ensuring superior performance even under fluctuating conditions.
High frequency is the ***choice for measuring solids and materials with low dielectric constants.
