





EDX-8800M MAX XRF Spectrometer
VerticalXFluorescence Spectrometer
Material Analysis Expert

Simply the Best
>Vertical integrated design, featuring a high-power sample excitation system and a high-counting rate detector
>Built-in vacuum pump and helium inflation system for various material composition analysis, including solids, liquids, alloys, powders, and sludges.
>Scope of Analysis11NaSodium To 92UUranium (periodic table element), analyzable oxides.
>High-resolution large beryllium window detectors paired with a multi-combination of filter systems, effectively enhance the detection limit of trace elements.
>The spin platform for samples can be mounted, effectively increasing the measurement area of the samples.
>Offer various data access interfaces, compatible withLIMSLab Management System
EDX8800M MAXEnergy Dispersive Fluorescence Spectrometer-Material Analysis Expert
As a high-performance verticalXRay FluorescenceEDXRFMaterial analyzerEDX8800M MAXEquipped with high powerXGamma-ray excitation system, paired with high-count rate and high-resolutionFSDDDetector, offering exceptional linear dynamic range, enabling higher precision process and quality control in metals, cement, minerals, mining, glass, and ceramics.

ESIInfocusEDX8800M MAXSpectrometers are primarily used in third-party laboratories and various locations requiring high-precision material composition analysis.
EDX8800M MAXSpecializing in qualitative and quantitative analysis of major, trace, and ultra-trace elements or compounds in various materials, widely applied to: alloy materials, precious metals, iron ore fines, non-ferrous metals and powders, metallurgy, metal and non-metallic mineral resources, refractory materials, raw refractory materials, titanium dioxide, gypsum, catalysts, ceramics, cement, lime, glass industry, quartz, feldspar, calcite, clay, rock wool, soil, solid waste, dust removal ash, red mud, fly ash, rare earth permanent magnets, petroleum products, slag, and other raw materials and finished products for quick qualitative and quantitative chemical analysis. Fast, accurate, non-destructive, and environmentally friendly, no need for acidic or alkaline chemical reagents.
EDX8800M MAXApplication Direction
>RoHSFiltering Test, Rapid Screening for Harmful Metals
>Petroleum & Chemicals: Fuel, lubricant monitoring, additives, wear metals, etc., sulfur element analysis
>Environment: Wastewater, Air Pollution, Soil and Ground, Emission Control
>Coating Thickness and Film: Analyze multilayer coatings, steel coatings, impurities
>Crime investigation and public security: evidence analysis, material matching, explosives
>Research, universities, material development
Product Features
•EquippedThe Peltier electric refrigeration FSDD silicon drift detector boasts excellent short-term repeatability and long-term reproducibility, as well as exceptional elemental peak resolution.
• Conduct simultaneous elemental and oxide composition analysis
• Specifically designed optical paths and vacuum systems greatly enhance the performance of light elements (Na, Mg, Al, Si, P)The test sensitivity and accuracy. Optional helium system available for direct testing of liquid and powder samples.
• Eight optical path alignment systems, automatically switch according to different sample sizes; also, can test different positions of the sample and calculate the average to reduce errors caused by sample inhomogeneity.
• High-definition built-in camera, clearly displaying the sample area detected by the instrument
• Equipped with a sample spinning platform for increased testing area, enhancing test accuracy and precision.

Equipped with a spinning platformEDX8800 MAXStructure Diagram
InfiniSpec Dedicated Spectrometer Composition Analysis Software
Infinesoft Software Core-Core software algorithms includeFPBasic Parameter MethodShermanEquationECExperiential Coefficient Method, AlphaAlpha Theory Parameter Method. Relying on Infinisys' powerful and stable hardware system, loadingFPThe correction for the enhanced absorption effect between elements can be achieved at the core of the law.
>Can be calibrated for testing with non-equivalent reference samples; reduces the number of reference samples needed for analysis, allowing for the analysis of unknown components with a wide range of concentration changes using one or several reference samples.
>Energy calibration, spectral stability, automatic peak element identification, dead-time correction, peak correction, escape peak correction, overlap correction, background subtraction
>Results can be refreshed in real-time.
>Spectral Display: Peak overlap comparison, capable of displaying multiple spectral graphs simultaneously.
>Multiple spectral intensity calculation methods, Gaussian fitting, pure element fitting.FPFitted, Net Area
Typical Application Test Report
1Alloy Application Cases
Samples prepared by the tablet pressing method, silicon iron powder samples10Test Stability Report
Measurement | Si | Al | P | Ca | Cr | Fe | Ni | Cu | Ti | Mn |
Silicon Iron-1 | 74.1916 | 1.9012 | 0.0217 | 2.033 | 0.0486 | 20.7858 | 0.0112 | 0.0243 | 0.0427 | 0.2371 |
Silicon Iron-2 | 74.0861 | 1.8382 | 0.0228 | 1.9934 | 0.0426 | 20.8245 | 0.0106 | 0.0222 | 0.0411 | 0.216 |
Silicon Iron-3 | 74.1615 | 1.8326 | 0.0228 | 1.9874 | 0.0425 | 20.7617 | 0.0106 | 0.0221 | 0.0412 | 0.2153 |
Molybdenum Disilicide-4 | 74.1673 | 1.8954 | 0.0217 | 2.0269 | 0.0484 | 20.7231 | 0.0114 | 0.0242 | 0.0426 | 0.2364 |
Silicon Iron-5 | 74.1118 | 1.8289 | 0.0227 | 1.9834 | 0.0424 | 20.7198 | 0.0104 | 0.0221 | 0.0409 | 0.2149 |
Silicon Iron-6 | 74.1178 | 1.8916 | 0.0216 | 2.0228 | 0.0483 | 20.6813 | 0.0112 | 0.0239 | 0.0425 | 0.236 |
Silicon Iron-7 | 74.1516 | 1.8062 | 0.0217 | 2.0131 | 0.0486 | 20.7652 | 0.0113 | 0.0241 | 0.0421 | 0.2351 |
Molybdenum Disilicide-8 | 74.1861 | 1.8532 | 0.0228 | 1.9814 | 0.0426 | 20.8015 | 0.0108 | 0.0222 | 0.0413 | 0.2162 |
Silicon Iron-9 | 74.1715 | 1.9346 | 0.0228 | 1.9754 | 0.0425 | 20.7607 | 0.0106 | 0.0221 | 0.0415 | 0.2143 |
Silicon Iron-10 | 74.1373 | 1.8958 | 0.0217 | 2.027 | 0.0484 | 20.7212 | 0.0108 | 0.0243 | 0.0421 | 0.2394 |
Average | 74.14826 | 1.8678 | 0.0222 | 2.0043 | 0.0455 | 20.7545 | 0.0109 | 0.0232 | 0.0418 | 0.2261 |
Standard Deviation | 0.0343 | 0.0412 | 0.0006 | 0.0223 | 0.0031 | 0.0434 | 0.0004 | 0.0011 | 0.0007 | 0.0114 |
Tablet Sample Preparation Steps: Grinding Preparation-Weigh-Mixed with adhesive-Use a tablet press to compact tablets-On-machine Test
2Raw Material Application Cases
Samples prepared by the fused bead method, limestone samples10Stability Test Report
Measurement Frequency | MgO | Al2O3 | SiO2 | S | K2O | CaO | MnO | Fe2O3 |
Limestone Standard Sample-1 | 0.511 | 0.101 | 0.338 | 0.095 | 0.044 | 91.166 | 0.008 | 0.115 |
Limestone Standard Sample-2 | 0.529 | 0.106 | 0.338 | 0.095 | 0.046 | 91.255 | 0.007 | 0.111 |
Limestone Standard Sample-3 | 0.524 | 0.104 | 0.348 | 0.089 | 0.045 | 91.038 | 0.008 | 0.113 |
Limestone Standard Sample-4 | 0.511 | 0.103 | 0.328 | 0.091 | 0.045 | 91.327 | 0.007 | 0.110 |
Limestone Standard Sample-5 | 0.523 | 0.103 | 0.348 | 0.093 | 0.044 | 90.883 | 0.007 | 0.106 |
Limestone Standard Sample-6 | 0.534 | 0.109 | 0.357 | 0.092 | 0.048 | 91.124 | 0.007 | 0.115 |
Limestone Standard Sample-7 | 0.515 | 0.098 | 0.346 | 0.091 | 0.045 | 91.143 | 0.008 | 0.110 |
Limestone Standard Sample-8 | 0.545 | 0.103 | 0.328 | 0.091 | 0.047 | 91.079 | 0.007 | 0.110 |
Limestone Standard Sample-9 | 0.531 | 0.104 | 0.348 | 0.098 | 0.045 | 90.722 | 0.007 | 0.114 |
Limestone Standard Sample-10 | 0.546 | 0.097 | 0.339 | 0.095 | 0.045 | 90.772 | 0.007 | 0.116 |
Average | 0.525 | 0.103 | 0.342 | 0.093 | 0.045 | 91.043 | 0.007 | 0.112 |
Standard Deviation | 0.0129 | 0.0034 | 0.0088 | 0.0026 | 0.0012 | 0.1916 | 0.0005 | 0.0031 |
Quick Pellet Preparation Method Sample Preparation Steps: Grinding Sample Making-Take a sample-Pre-oxidation-Add melting sample reagent-Fused film machine, fused sheet-Cooling-Machine Test
3Ore Application Cases
Samples prepared by the fused quartz method, quartz sand10Test Stability Report
Measurement Frequency | MgO | Al2O3 | SiO2 | CaO | TiO2 | Fe2O3 |
Quartz Stone-1 | 0.0754 | 0.0921 | 99.5393 | 0.0784 | 0.0072 | 0.0311 |
Quartz Stone-2 | 0.0615 | 0.0856 | 99.4563 | 0.0792 | 0.0071 | 0.0296 |
Quartz stone-3 | 0.0646 | 0.0825 | 99.4271 | 0.0783 | 0.0072 | 0.0326 |
Quartz Stone-4 | 0.0718 | 0.0896 | 99.3529 | 0.0781 | 0.0082 | 0.0312 |
Quartz Stone-5 | 0.0687 | 0.0754 | 99.383 | 0.0783 | 0.0079 | 0.0295 |
Quartz stone-6 | 0.0792 | 0.0765 | 99.3696 | 0.0781 | 0.0069 | 0.033 |
Quartz stone-7 | 0.0659 | 0.0797 | 99.4711 | 0.0783 | 0.0067 | 0.0286 |
Quartz stone-8 | 0.0729 | 0.0803 | 99.5004 | 0.0789 | 0.0073 | 0.0301 |
Quartz stone-9 | 0.0776 | 0.0761 | 99.43296 | 0.08 | 0.008 | 0.0311 |
Quartz stone-10 | 0.0631 | 0.0819 | 99.4739 | 0.0783 | 0.0063 | 0.0306 |
Average | 0.07007 | 0.08197 | 99.440656 | 0.07859 | 0.00728 | 0.03074 |
Standard Deviation | 0.0062 | 0.0057 | 0.0595 | 0.0006 | 0.0006 | 0.0013 |
Typical Quartz SandXRFSpectral chart
Material Testing ExpertEDX8800M MAX
>Instrument Parameters
Instrument dimensions: 650mm*600mm*900mm |
Instrument weight: 105Kg |
Element Analysis Range:Na11-U92Sodium to Uranium |
Detector: High-resolution electro-cooledFSDDSilicon Drift Detector |
High-throughput counting rate linear dynamic range:1000-1000000cps Including signal enhancement processing moduleSNE |
Multi-Analyzer: 4096Dào (This character is a Chinese character and has no direct translation in English. If it's part of a word or phrase, please provide the full context.)DPP analyzer Analyzer, peak drift less than0.5Please provide the Chinese content to be translated.24Hour(s) |
XTungsten Halogen Lamps: High-power Beryllium Window Lamps (optional with high-power composite target material lamps) |
High-pressure generator unit:0-100kV |
Sample Observation System:100020 Megapixels High DefinitionCCDCamera, including sample spot image positioning function |
Data Processing SystemMCA: Control response time less than100Milliseconds, capable of simultaneous collection9Road feedback signals, real-time monitoring including pipe pressure, pipe flow, baseline, dead time, temperature, count rate, vacuum degree, collimator, filter state signals |
Sample cavity: Air, vacuum, helium (optional). Built-in high-power vacuum pumpFully automated software-controlled vacuum system, dual vacuum extraction mechanism, standard with automatic vacuum stability system |
Voltage:220ACV 50/60HZ |
Ambient Temperature:-10 °C To35 °C |
Optional configuration: 1Sample Spinning System, fits sample diameter90mm。 2Rechargeable helium mini sample chamber. |
Instrumentation configuration
>Standard Configuration | >Optional Configuration-Sample Pre-Processing System |
PureAgInitial sample | Grinding Sample Machine |
Vacuum Pump (Built-in) | Manual tablet pressESI30T |
Powder sample cup, liquid sample cup | Automatic Tablet Press MachineESI30S |
USBData Cable | Fuel Sample Cup |
Power Cord | Drying Oven |
XRFTest Films (powder, liquid, oil) | ESI-900Automated Sample Melting Machine for Spectroscopic Analysis |
Instrument Factory and Calibration Report | Electronic Scale |
Warranty Card | Standard Sample |
High-precision AC purifying voltage stabilizer power supply | 150Mesh sieve |





