详情描述

FT-300TZ Two-Probe Resistivity Tester

Feature Descriptionnal description

Applicable to semiconductor material enterprises, research institutions, universities, and laboratories for analyzing the longitudinal resistivity of semiconductor materials.Measurable resistivity of uniformly cross-sectional circular, square, or rectangular silicon single crystals; the ratio of sample length to cross-sectional size should be not less than 3:1.Configure measurement platformAutomatic positive/negative current output, automatic positive/negative voltage measurementLCD display with temperature compensation function, automatic selection of resistivity units, optional PC software for real-time data and report management; available in both Chinese and English versions.

Reference StandardsReference standards

GB/T 1551-2021Measurement of Silicon Single Crystal Resistivity Direct-reading four-probe method and direct current two-probe method

SEMI MF 397-1106 <<Two-probe Method for Silicon Rod Resistivity Measurement>>

Parameters and specificationsTechnical data

Resistivity: 10^-7 to 2×10^7 Ω-cm
Resistance: 10^-7 to 2×10^7 Ω

Conductivity: 5×10^-7 to 10^7 s/cm

Resolution: 0.1μΩ Measurement Error ± (0.05% of Reading ± 5 digits)

5. Voltage Measurement Range: 2mV, 20mV, 200mV, 2V; Measurement Accuracy ± (0.1% of Reading)

6. Resolution: 0.1uV, 1uV, 10uV, 100uV

7. Current Output: DC current, adjustable from 0 to 1000mA.

8. Display Method: LCD Display - Resistance Value, Resistivity, Conductivity Value, Temperature, Automatic Unit Conversion, Cross-sectional Area, Height, Current, Voltage, etc.

9. Temperature Requirement: 23℃ ±1℃

Power: 220±10% 50/60 Hz

11. Measurement platform parameters are as follows:

1）.Measurable Silicon Core, Inspection Rod Dimensions: Diameter 4~22㎜(Other specifications available for customization)

2). The probe repeatedly contacts the sample at the same position, with no lateral movement.

3）.Two-probe testing probe. Probe spacing: 1.59mm(Other specifications available for customization)Probe mechanical yaw rate: ±0.3%.

4）.Probe Diameter: 0.8 mmTotal probe pressure: 6-12N, probe material: tungsten needle

5）.Insulation resistance between probes and between probes and other parts exceeds 109European

12. Standard Equipment, Optional Add-ons：a. 1 set of PC software; b. 1 piece of standard resistor; c. computer and printer