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Four-Probe Resistance/Resistivity Tester
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详情描述
FT-371 Semi-insulating Material Dual Electrode Four-probe Tester
One.Overview:
Four-probe method for testing high-resistance material sheet resistance and resistivity, can test up to10^10ΩResistance, Liquid Crystal Display, Chip Control, Constant Current Output Four-probe dual-position measurement, reference to the U.S. A.S.T.M Standard. Available in Chinese or English versions..
Two.Application Range:
Cover Film;Conductive polymer film, high and low temperature electric heat film;Insulating and conductive window film - Conductive(Shield)Fabric, decorative film, decorative paper;Metalized labels, alloy foil;Melting, sintering, sputtering, coating, coated layer, resistive, capacitive touchscreen films;Electrode coatings, resistance measurements for other semiconductor materials, and thin film materials,Silicon ingots, chip resistivity, diffusion layer, epitaxial layer.ITOConductive foil, conductive rubber, and other materials - sheet resistance Semiconductor materials,Wafers, solar cells, electronic components, conductive filmsITOConductive film glass, metal film, conductive paint film, evaporated aluminum film.PCBCopper foil filmEMICoating materials' thin-film resistance and resistivity Conductive paint, conductive paste, conductive plastic, conductive rubber, conductive film, metallic film. EMI Protective materials, conductive fibers, conductive ceramics, etc..
Three.Parameter InformationParameters:

FT-371 Semi-insulating Material Dual Electrode Four-probe Tester
Model and Specifications | FT-371A | FT-371C |
1.Square Resistance Range | 10^-4~1×10^7Ω/□ | 10^-4~1×10^10Ω/□ |
2.Resistance range | 10^-5~2×10^8Ω-cm | 10^-5~2×10^11Ω-cm |
3.Test Current Range | 10mA ---200pA | 10mA ---2pA |
4.Current Accuracy | ±2% | ±5% |
5.Resistance Accuracy | ≤10% | ≤15% |
6.Display Reading | LCD Display: Resistance, Resistivity, Square Resistance, Temperature, Unit Conversion, Temperature Coefficient, Current, Voltage, Probe Shape, Probe Spacing, Thickness Conductivity | |
7.Testing Method | Combined dual power test method | |
8.Work Power Supply | Input: AC 220V±10%.50HzPower Consumption:<30W | |
9.Tolerance | ≤15% | |
10.Select Features | Select1.pcSoftware; Selection2.Square probe; Select & purchase3.Linear probe; Select4.Test Platform | |
11.Test Probe | Probe Spacing Selection: 2mm;3mmTwo sizes; Probe Material Selection: Tungsten Carbide Pins, Gold-Plated Phosphor Bronze Hemispherical Pins | |




FT-371 Semi-insulating Material Dual Electrode Four-probe Tester
Standard Configuration and Additional Ordering Details:
Serial Number | Model | Product Name | Unit | Quantity | Note |
1 | 371-CSX | Test Line | Set | 1 | |
2 | 09A | Standard Resistor | Unit | 1-5 | Select specifications and quantities |
3 | 06A | Four-probe testing platform | Set | 1 | With probe1 piece |
4 | 06B | Four-probe probe | Please provide the Chinese content you would like to be translated into American English. | 1 | Linear |
5 | 340-TTZ | Gold-plated Spring Copper Needle4 pieces | Group | 1 | A set of 4 |
6 | 340-WTZ | Spring Tungsten Needle4 pieces | Group | 1 | A set of 4 |
7 | 340-RJ | AnalyzeSoftware | Set | 1 | |
8 | PC | Computer+Printer | Set | 1 | Configure according to customer requirements |
9 | 300-JL | Testing and Technical Service | Copy | 1 | Measurement CertificateOne piece |
10 | WDCGQ | Temperature Sensor | Set | 1 | Room temperature-125 degrees |
Extended Warranty Service | Year | 1-3 |











