Rockwell Automation 1734-FPD Module Special Offer

1. Functional testing cannot replace parameter testing.

2. Functional testing can only detect the cutoff, amplification, and saturation regions of the device, but it cannot determine the working frequency's high or low and the speed's fast or slow at this point.

3. For digital chips, we only know about the changes in high and low level outputs, but cannot determine the speed of the rise and fall edges.

4. For analog chips, they handle analog variations. The complexity arises from the distribution of circuit components and the different influences on signal schemes. As of the current online testing technology, it is impossible to conduct online testing for analog chips. Therefore, the results of this functional test can only be referenced.

5. Most online test instruments, after conducting functional tests on various chips on circuit boards, will provide "Test Passed" or "Test Failed." So why don't they indicate whether the tested device has issues? This is a shortcoming of such test instruments. Because there are too many factors that can affect (interfere with) the online testing. Measures need to be taken before testing, such as disconnecting the crystal oscillator, removing the CPU and programmed chip, and adding isolation for interrupt signals, etc. Whether these measures are always effective is worth studying. At least, the current test results are sometimes not as satisfactory as expected.

6. Readers of online testers are familiar with this saying: "A chip that fails the online test is not necessarily damaged; a chip that passes the test is definitely not damaged." The explanation is that if a device is affected by online interference or resistance, the result may not pass, which is easy to understand. However, does a damaged chip always result in a "fail" during testing? The answer is certainly not. Both the author and colleagues have encountered situations where a chip is clearly damaged (specifically, the board does not work when this chip is installed), but the test result is a pass. This is attributed to the working principle of the tester itself (post-drive technology). Therefore, we cannot over-rely on the capabilities of online testers (although manufacturers often hype them), otherwise, it may lead to misdirection in repairing circuit boards.

Rockwell Automation 1734-FPD Module Special Offer

Rockwell Automation 1734-FPD Module Special Offer

Airing and Rockwell Automation will establish a stable and effective strategic partnership in the upgrading and transformation of "5G+Industrial Internet." Based on the deep understanding and consensus of industrial control networks and informatization scenarios, we will create an integrated solution for manufacturing enterprises, focusing on automation, digitalization, informatization, intelligence, and integration. This will involve effectively integrating Airing's 5G industrial field network solutions with Rockwell Automation's industrial control I/O systems, PLCs, switches, and other equipment, to construct a comprehensive wireless dedicated cloud network solution that encompasses both hardware and software. This solution will better meet the needs of manufacturing in production lines and workshops, thereby optimizing production line costs and improving efficiency.