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Integrated System
Customized Applications
Optical Applications
Electrical Applications
Thermodynamics Applications


详情描述
Product Description
Utilizing the thermoelectric effect of Peltier elements, when paired with a thermostatic circulation pump, cooling down to -35°C can be achieved without the need for refrigerants like liquid nitrogen.
Core Advantages

Technical Specifications
One, the system composition of the small vacuum high and low temperature probe stage includes:
Probe Stage Body
2. Microscope
3. Monitor camera components
4. Probe Mount & Fixture
5. DC Probes
6. Kelvin Probe
7. RF/Microwave Probe
8. Optical Wave Probe
9. Optical Isolation Platform
10. Adapter plug
11. Vacuum Pump
12. Additional Upgrade Components
II. Detailed Description:
(1) Overall Specifications and Features:
Weight: 30 kg
2. Dimensions: 450mm wide × 400mm deep × 600mm high
3. Enhanced ergonomic design for comfortable long-term operation by engineers.
(II) Chuck Specifications:
1. 40×40mm platform, flatness: ±3μm
2. The loading platform uses vacuum suction to hold the samples, with the small sample size being 5mm x 5mm.
3. Carriage X-Y axis fine travel 101.6mm × 101.6mm, fine resolution 1μm
4. Z-axis micro-adjustable lifting and lowering 10mm, micro-adjustable resolution 1μm
5. The carriage has a horizontal angle adjustment range of 0° to 360° with a rotation accuracy of 0.01°.
6. The loading platform is electrically independently suspended, capable of serving as a back electrode.
(3) Needle Clamp Table Specifications:
U-shaped polished stainless steel countertop
2. Pin Seat Table Flatness: ±3μm
3. Number of needle holders: 4-6.
(4) Microscope Operation Specifications:
Equipped with an adjustable arm mechanism, allowing for quick movement of the microscope in any X-Y direction.
2. The microscope's Z-axis features a focusing knob, allowing a travel distance of 50.8mm along the Z-axis with a movement precision of 1μm.
(V) Application Scenarios:
DC IV/CV Testing
2. Pulse IV Test
3. Impedance Test
4. Time Domain Analysis Test
5. Active RF Testing
6. Passive RF/Microwave Testing














