详情描述

Product Overview

Miniature high/low temperature probe stage for electrical testing under temperature variations, capable of controlling temperatures within the range of -190~600°C, enabling in-situ temperature variation electrical tests of samples in open/airtight/vacuum environments, with reflection/transmission.

Supports compatibility with instruments such as microscopes, spectrometers, semiconductor testers, and electrical source meters.

Core Technology

Technical Specifications

Application Cases